Edwin test launches multi-function T2000 AiR system

The leading manufacturer of semiconductor test equipment has begun accepting orders for the latest T2000 AiR test system, a compact, air-cooled thermal test system designed to meet the low-cost testing requirements of the R & D stage and a small number of diverse production processes. Health. It is expected to begin shipping to customers in the first quarter of 2017.

Demand for smartphones and other mobile devices continues to rise in the global marketplace, and consumer and business demand for network services is increasing, pushing up the production of complex semiconductor wafers and modules. These chips and modules integrate microcontrollers (MCUs) and application processors to perform a variety of functions including electronic communications, power management, and message sensing. pcm-5820-g0b2

The new T2000 AiR is designed to provide a wide range of test solutions for these various module and system-on-package (SiP) wafers. The modularity of the test stand provides excellent flexibility, and can be configured with up to six independent air-cooled heat measurement modules for a wide range of high integration The multifunction chip provides a single system test. This system is specifically designed to perform digital functions as well as sweep tests (up to 512 parallel channels), including high voltage wafers up to 2,000 volts, precision DC converters, automotive DC wafers, max. Up to 100MHz mixed-signal integrated circuits (ICs), radio frequency communication chips, and complementary metal-oxide-semiconductor (CMOS) image sensors.

This new test machine can be integrated with the M48xx series of classifiers to create high-performance, space-saving test solutions. The Advantest test is called the integrated Zero Zero Test Station. Since the T2000 AiR does not require a water-cooled heatsink, it can be installed anywhere. Moreover, the system’s software environment is fully compatible with the highly scalable T2000 series, so you can carry out large-scale parallel test, speed up the production process, help users to shorten new products to market. xc3s200-4tqg144c

“With the introduction of the new T2000 AiR, Advantest continues to expand the capabilities of both the T2000 platform to further meet the requirements of integrated component manufacturers (IDMs), wafer generations,” said Masayuki Suzuki, Senior Vice President of the SoC Test Business Group. Factories and applications of the IC design industry, the testing needs of the industry.

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