Tektronix, the world’s leading provider of measurement solutions, today introduced the industry’s first test solution for the open NAND Flash Interface (ONFI) standard. The ONFI 4.0 test solution is suitable for Tektronix high performance oscilloscopes, including software for analyzing DDR2 / 3 modes on the ONFI bus, as well as an efficient probing solution based on Interposers.

The ONFI standard, published by the ONFI Working Group, is intended to simplify the integration of NAND flash memory into consumer electronics and computing platforms. The ONFI 4.0 specification introduces the evolving NV-DDR3 interface with VccQ = 1.2V, which not only improves performance but also improves power consumption and expands NV-DDR2 and NV-DDR3 I / O speeds to 667 MT / S and 800 MT / s, an increase of ZQ calibration. 7101j52zqe22

Due to the speed and voltage drop, designers dealing with ONFI buses face many challenges, such as ensuring consistency, debugging timing problems, and getting signals. With the TEK-PGY-ONFI software, design and test engineers can test whether the ONFI interface meets ONFI bus timing parameters and automatically measure Command, Address, Data in, and Data out services. The detailed view function in the TEK-PGY-ONFI software helps annotate timing problems by associating each electrical measurement of an ONFI waveform with an analog waveform by annotating it.

Intensive encapsulation and high data rates challenge high-fidelity signal access in NAND flash devices. Tektronix supports a variety of mechanical configurations, including probe designs with sockets, direct probe design, and patented edge probe designs to meet exceptionally tight mechanical requirements. Interposers and probe S-parameter models are provided to model or generate an inverse-fit filter that is applied to the oscilloscope.

The TEK-PGY-ONFI software runs on Tektronix MSO / DPO70000 Series oscilloscopes with bandwidths of 4GHz to 33GHz. P7500 or P7300 series probes are recommended for testing. Tektronix recommends using Nexus-developed ONFI 152 spherical NAND Flash Edge high-fidelity interpolators (Interposers) for signal access while maintaining signal integrity while some customers may have difficulty or no access to signals during ONFI testing . 74435572200

“This ONFI test solution provides customers with the insight they need to bring memory-based products to market faster and with greater confidence,” said Brian Reich, general manager, Tektronix Performance Oscilloscopes, Compared to manual testing, this solution significantly reduces compliance time, simplifies commissioning and ultimately increases productivity. ”

The new TEK-PGY-ONFI software complements Tektronix ‘comprehensive solution for other memory technologies, including eMMC, UFS and DDRA.